Wear

All flash devices suffer from wear, since the repeated use of a particular area of flash increases the likelihood that it will fail. Distributing the usage of blocks across the whole flash array greatly increases the lifetime of NAND devices, but effective wear levelling is a complex task. Seemingly “obvious” algorithms tend to fail in real-world testing. HCC has developed sophisticated wear algorithms (both static and dynamic) that are tuneable to your systems needs. These ensure that all the blocks in a NAND flash array are written to evenly, within a configurable set of specified parameters.